N2797A Extreme Temperature Active Probe Provides Reliable High and Low Temperature Testing

Many engineers need to verify the performance of their products at different operating temperatures. To date, extreme temperature testing requires engineers to use the probe over a non-specified temperature range, which can damage the probe. Whether active or missing probes, most probes have a specified operating temperature range from 0 to 50 degrees Celsius. The new Agilent N2797A Extreme Temperature Active Probe operates over a wider temperature range (-40 to 85 ° C) without damage. Engineers can use probes and probe accessories in the temperature chamber, and the probe adapter and oscilloscope are located outside the temperature compartment.

Reliability temperature testing is very important in the electronic design process. It helps detect product failures early; determine reasonable calibration/warranty times; and understand the long-term performance of the product under extreme temperature conditions. The electronics industry divides the temperature into three levels. The first is the so-called standard range or commercial grade, and the product is fully warranted from 0°C to +40°C. –45°C to +80°C is a more stringent temperature range and is typically used for extreme testing of consumer electronics. Finally, the extreme temperature range is typically used in the military, automotive and aerospace industries, ranging from –55°C to +150°C.

Test engineers often face a dilemma when performing environmental testing on electronic products: the detection system must be able to adapt to severe environmental conditions like a product. For example, intensive life testing of in-vehicle equipment requires a temperature range of -55 ° C to +150 ° C. To date, extreme temperature testing requires engineers to use the probe over a non-specified temperature range, which can damage the probe. Whether active or missing probes, most probes have a specified operating temperature range from 0 to +50 °C. Thermal expansion of the coaxial cable dielectric material can damage these conventional probes. The plastic case begins to deform at temperatures above +60 °C. As the temperature approaches the limit, the frequency response of the active probe amplifier begins to decrease. Figure 1 shows the failure of the external shield of a normal coaxial cable after the high temperature aging test.

N2797A Extreme Temperature Active Probe Provides Reliable High and Low Temperature Testing

Figure 1: Environmental testing was completed at a high temperature of 120 °C, and the conventional probe was damaged.

Figure 2 shows X-fiber inspection of the probe connector after multiple thermal cycles in the environmental chamber. The media material in the coaxial cable shrinks and the center probe is pulled out of the socket. This degradation eventually leads to DC discontinuities.

N2797A Extreme Temperature Active Probe Provides Reliable High and Low Temperature Testing

Figure 2: Probe connector failure due to thermal cycling.

Instead of placing fragile probes in the environmental chamber, test engineers often use extension cables to connect targets and oscilloscopes. However, this method is seriously inadequate. First, it greatly limits bandwidth, which can also cause non-flat frequency response due to prolonged parasitic inductance and capacitance of the input cable. The typical ground inductance is 1 nH/mm. A one meter long extension will produce an inductance of approximately 1 μH in the detection path, resulting in a measurement bandwidth as low as a few kHz. Another problem is that the signal distortion caused by electromagnetic coupling is becoming more and more obvious. The longer the extension line, the longer the coupling path. As the complexity of the design deepens, the density of electromagnetic noise sources also increases. The extension cord functions like a receive antenna and is capable of effectively coupling electromagnetic noise in the measurement path. Finally, the extension cable adds extra load to the circuit under test. Sometimes this load is too obvious. For example, a typical FR4 50Ω coaxial cable has a load of 20pF/m. For high-impedance circuits, excessive loads can severely distort the signal, causing malfunctions.

Separate Slip Ring

A separate slip ring is a device that allows two or more rotating electrical shafts to be connected without having to pass the electricity through the shafts' bearings. This is often used in situations where there is a need to power something externally while the shaft is still turning. For example, a machine might have a drive shaft that powers it while also having a separate output shaft that needs to turn at a different speed. By using a separate slip ring, these two shafts can be powered without any interference.


Slip Ring Shaf is a key component of a slip ring. It is the shaft on which the rotary electrical contacts are mounted. The shafts must be strong enough to support the weight of the contacts and must be able to turn freely. There are many factors to consider when selecting a shaft material, including strength, corrosion resistance, and operating temperature.


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